Study of Solid State Surfaces using a Atomic Force Microscope (only in German)
Supervisor: Dr. habil. Michael Lorenz, Wolfram Fritzsche
Atomic Force Microscopy (AFM) allows in
contradiction to STM the investigation of electrically isolating
samples. Furthermore, the lateral and vertical scan range is much
larger. In this experiment, several samples with surface structures in
the micrometer and nanometer range will be investigated using the AFM
instrument Easy Scan in contact mode, for example an integrated memory
circuit, a calibration lattice, a CD-ROM, an optical diffraction
lattice, and some granular nanocrystalline thin films.
As methodical base, the repulsive and attractive interaction forces for
distances in the nm-range will be discussed. Furthermore, the operation
principles of a AFM, the influence of the stiffness of the cantilever,
and the static and dynamic operation principles contact mode and
tapping mode will be presented. For comparison of the lateral
resolution, all samples will be investigated by a conventional optical
microscope.
The experiment provides an extensive practical impression of the
possibilities and limitations of the surface investigation by AFM.
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