Study of Solid State Surfaces using a Atomic Force Microscope
Supervisor:Dr. S. Vogt
Atomic
Force Microscopy (AFM) allows in contradiction to STM the
investigation of electrically isolating samples. Furthermore,
the lateral and vertical scan range is much larger. In this
experiment, several samples with surface structures in the
micrometer and nanometer range will be investigated using the
AFM instrument Easy Scan in contact mode, for example an
integrated memory circuit, a calibration lattice, a CD-ROM, an
optical diffraction lattice, and some granular nanocrystalline
thin films.
As methodical base, the repulsive and attractive interaction
forces for distances in the nm-range will be discussed.
Furthermore, the operation principles of a AFM, the influence
of the stiffness of the cantilever, and the static and dynamic
operation principles contact mode and tapping mode will be
presented. For comparison of the lateral resolution, all
samples will be investigated by a conventional optical
microscope.
The experiment provides an extensive practical impression of
the possibilities and limitations of the surface investigation
by AFM.
