Photothermal Microscopy and
Spectroscopy Webinar

Recently developed optical photothermal IR (O-PTIR) microscopy not only overcomes the diffraction limit in direct IR imaging, but also circumvents the limitations in AFM-IR. In O-PTIR microscopy, a visible beam probes the thermal effects induced by an intensity-modulated infrared beam. Unlike AFM-IR, O-PTIR can be measured in wide-field manner through an interferometric scattering microscope, a phase microscope, or an interferometric objective. In wide-field O-PTIR, focal area matching of the IR beam with the visible beam and camera-based paralleled detection offer a high imaging speed. Meanwhile, thermal confinement after nanosecond IR pulse excitation offers sub-micron spatial resolution. O-PTIR microscopy has find important applications in life science and materials science.