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Hirsch index (based on Publons)
h=76 (01/2024, 757 publ., 27870 cit.)
Hirsch index (based on Google Scholar)
h=92 (01/2024, 46518 cit., last 5y: h=45, 5 most quoted: 4583, 1733, 1478, 1428, 1137)
  Publons/ResearcherID
  ORCID iD

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7
C. Scarlat, K.M. Mok, S. Zhou, M. Vinnichenko, M. Lorenz, M. Grundmann, M. Helm, M. Schubert, H. Schmidt
Voigt effect measurement on PLD grown NiO thin films

Phys. Status Solidi C 7(2), 334-337 (2010)
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6
Frank Lipski, Sarad B. Thapa, Joachim Hertkorn, Thomas Wunderer, Stephan Schwaiger, Ferdinand Scholz, Martin Feneberg, Michael Wiedenmann, Klaus Thonke, Holger Hochmuth, Michael Lorenz, Marius Grundmann
Studies towards freestanding GaN in hydride vapor phase epitaxy by in-situ etching of a sacrificial ZnO buffer layer

Phys. Status Solidi C 6(52), S352-S355 (2009)
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5
M. Lorenz, G. Wagner, A. Rahm, H. Schmidt, H. Hochmuth, H. Schmid, W. Mader, M. Brandt, H. von Wenckstern, M. Grundmann
Homoepitaxial ZnO Thin Films by PLD: Structural Properties

Phys. Status Solidi C 5(10), 3280-3287 (2008)
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4
C. Sturm, T. Chavdarov, R. Schmidt-Grund, B. Rheinländer, C. Bundesmann, H. Hochmuth, M. Lorenz, M. Schubert, M. Grundmann
Investigation of the free charge carrier properties at the ZnO-sapphire interface in a- plane ZnO films studied by generalized infrared ellipsometry

Phys. Status Solidi C 5(5), 1350-1353 (2008)
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3
V.M. Voora, T. Hofmann, M. Brandt, M. Lorenz, M. Grundmann, M. Schubert
Electrooptic ellipsometry study of piezoelectric BaTiO₃-ZnO heterostructures

Phys. Status Solidi C 5(5), 1328-1331 (2008)
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2
J. Sellmann, Ch. Sturm, R. Schmidt-Grund, Ch. Czekalla, J. Lenzner, H. Hochmuth, B. Rheinländer, M. Lorenz, M. Grundmann
Structural and optical properties of ZrO₂ and Al₂O₃ thin films and Bragg reflectors grown by pulsed laser deposition

Phys. Status Solidi C 5(5), 1240-1243 (2008)
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1
G. Brauer, W. Anwand, W. Skorupa, J. Kuriplach, O. Melikhova, J. Cizek, I. Prochazka, H. von Wenckstern, M. Brandt, M. Lorenz, M. Grundmann
Defects in N⁺ ion-implanted ZnO single crystals studied by positron annihilation and Hall effect

Phys. Status Solidi C 4(10), 3642-3645 (2007)
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